Electrical Characterization Facility
Semiconductor Parameter Analysis
New User Charges for the instrument in the Electrical Characterization Facility
Note*: All service tax has to be changed as per GOI
S.No. |
Instrument Name |
Charges (In ₹) |
Charges (In ₹) |
Charges (In ₹) |
1. |
Ambient to high temperature probe station [A] |
₹ 200 per hour – Ambient condition ₹ 300 per hour – High temperature |
₹ 400 per hour + 18% (G.S.T) (Both for ambient and high temperature) |
₹ 800 per hour + 18% (G.S.T) |
2. |
Low temperature probe station [A] [B] |
₹ 400 per hour |
₹ 800 per hour + 18% (G.S.T) |
₹ 1600 per hour + 18% (G.S.T) |
3. |
Hall Effect Measurement |
₹ 200 per sample ₹ 300 per hour – Temperature dependent Temperature (300 K To 350 K) |
₹ 400 per sample + 18% (G.S.T) ₹ 500 per hour + 18% (G.S.T) – Temperature dependent Temperature (300 K To 350 K) |
₹ 800 per sample + 18% (G.S.T) ₹ 900 per hour + 18% (G.S.T) – Temperature dependent Temperature (300 K To 350 K) |
4. |
Sheet resistance measurement |
₹ 100 per sample |
₹ 200 per sample + 18% (G.S.T) |
₹ 400 per sample + 18% (G.S.T) |
5. |
Oscilloscope |
₹ 300 per hour |
₹ 500 per hour + 18% (G.S.T) |
₹ 1000 per hour + 18% (G.S.T) |
A) Along with semiconductor Parameter Analyzer
B) Involves measurements inside a vacuum chamber where the sample platform temperature is being controlled by a close loop cryostat and also a chiller is extracting the heat released by the cryostat.
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